## Abstract The present issue of physica status solidi (a) contains contributions from the International Workshop on Modulation Spectroscopy of Semiconductor Structures (MS^3^), held in Wrocław, Poland, 1–3 July 2004. Editor's Choice is the article by P. J. Klar et al. [1] in which the advantages
Characterization of vertical-cavity surface-emitting laser structures by modulation spectroscopy: A status report
✍ Scribed by Klar, P. J. ;Karcher, C. ;Metzger, B. ;Hosea, T. J. C.
- Publisher
- John Wiley and Sons
- Year
- 2005
- Tongue
- English
- Weight
- 414 KB
- Volume
- 202
- Category
- Article
- ISSN
- 0031-8965
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✦ Synopsis
Abstract
In recent years, various modulation spectroscopic methods have been successfully applied for characterizing vertical‐cavity surface‐emitting laser structures. We will survey the field and its present status describing the experiments performed so far, in particular, focussing on photomodulated reflectance and contactless electroreflectance experiments and the corresponding line shape models. We will summarize the successes of the methods, but we will also highlight open questions for future studies. (© 2005 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)
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