Characterization of Vanadium Doped 4H- and 6H-SiC Grown by PVT Method Using the Open Seed Backside

✍ Scribed by Racka-Dzietko, Katarzyna; Tymicki, Emil; Grasza, Krzysztof; Raczkiewicz, Marcin; Jakieła, Rafał; Kozubal, Michal; Jurkiewicz-Wegner, Elzbieta; Brzozowski, Andrzej; Diduszko, Ryszard; Piersa, Miroslaw; Kościewicz, Kinga; Pawłowski, Mariusz; Krupka, Jerzy

• Book ID: 121232398
• Publisher: Trans Tech Publications, Ltd.
• Year: 2010
• Tongue: English
• Weight: 473 KB
• Volume: 645-648
• Category: Article
• ISSN: 1662-9752
• DOI: 10.4028/www.scientific.net/MSF.645-648.21