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Characterization of undoped and silicon-doped InGaN/GaN single quantum wells

✍ Scribed by B. Schineller; P. H. Lim; G. P. Yablonskii; E. V. Lutsenko; O. Schön; H. Protzmann; M. Heuken; K. Heime

Book ID: 107452444
Publisher: Springer US
Year: 2000
Tongue: English
Weight: 172 KB
Volume: 29
Category: Article
ISSN: 0361-5235
DOI: 10.1007/s11664-000-0090-8

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