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Characterization of Thin Porous Silicon Films Formed on n[sup +]/p Silicon Junctions by Spectroscopic Ellipsometry

✍ Scribed by Strehlke, S.; Bastide, S.; Polgar, O.; Fried, M.; Clément, Lévy

Book ID
121672085
Publisher
The Electrochemical Society
Year
2000
Tongue
English
Weight
375 KB
Volume
147
Category
Article
ISSN
0013-4651

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