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Characterization of thin metastable vanadium oxide films by Raman spectroscopy

✍ Scribed by J. P. Schreckenbach; Klaus Witke; Diethard Butte; Günter Marx

Publisher: Springer
Year: 1999
Tongue: English
Weight: 89 KB
Volume: 363
Category: Article
ISSN: 1618-2650
DOI: 10.1007/s002160051175

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