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Characterization of thin films using heavy ion beams

✍ Scribed by H Timmers; R G Elliman; T R Ophel

Book ID: 110659873
Publisher: Springer-Verlag
Year: 1999
Tongue: English
Weight: 807 KB
Volume: 22
Category: Article
ISSN: 0250-4707
DOI: 10.1007/bf02749974

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