Characterization of the valence band offset in p-Si/Si1−xGex/Si by space charge spectroscopy

✍ Scribed by K. Schmalz; H. Rücker; I.N. Yassievich; H.G. Grimmeiss; B. Dietrich; H. Frankenfeld; W. Mehr; H.J. Osten; P. Schley

• Publisher: Elsevier Science
• Year: 1994
• Tongue: English
• Weight: 368 KB
• Volume: 37
• Category: Article
• ISSN: 0038-1101
• DOI: 10.1016/0038-1101(94)90332-8