Capture, storage, and emission of holes in Si/Si1−xGex/Si QW's for the determination of the valence band offset by DLTS

✍ Scribed by O. Chretien; R. Apetz; L. Vescan; A. Souifi; H. Lüth

• Publisher: Elsevier Science
• Year: 1996
• Tongue: English
• Weight: 307 KB
• Volume: 102
• Category: Article
• ISSN: 0169-4332
• DOI: 10.1016/0169-4332(96)00055-4