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Characterization of the optical properties of PECVD SiNx films using ellipsometry and reflectometry

✍ Scribed by L Asinovsky; F Shen; T Yamaguchi


Book ID
114086309
Publisher
Elsevier Science
Year
1998
Tongue
English
Weight
253 KB
Volume
313-314
Category
Article
ISSN
0040-6090

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