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Characterization of the creep exposed CMSX2 single crystal by neutron diffraction topography and neutron diffractometry

✍ Scribed by P. Strunz; P. Lukáš; P. Mikula; J. Šaroun; G. Albertini; F. Rustichelli; G. Cicognani; A. Di Gianfrancesco

Book ID
112593338
Publisher
Springer
Year
1994
Tongue
English
Weight
428 KB
Volume
44
Category
Article
ISSN
0011-4626

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