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Characterization of the chemical interactions between 4-MET and enamel by Raman spectroscopy

✍ Scribed by Yiuchong Leung; Michael D. Morris


Book ID
113233764
Publisher
Elsevier Science
Year
1995
Tongue
English
Weight
730 KB
Volume
11
Category
Article
ISSN
0109-5641

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Chemical characterization of SiCxNy nano
✍ O. Baake; N.I. Fainer; P. Hoffmann; M.L. Kosinova; Yu.M. Rumyantsev; V.A. Trunov πŸ“‚ Article πŸ“… 2009 πŸ› Elsevier Science 🌐 English βš– 357 KB

## SiC x N y nanolayers were synthesized by a remote plasma enhanced chemical vapour deposition (RPECVD) method and chemically characterized by Fourier transform infrared spectroscopy (FTIR), Raman spectroscopy, X-ray photoelectron spectroscopy (XPS), and near-edge X-ray absorption fine structure