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Characterization of swift heavy ion tracks in CaF2 by scanning force and transmission electron microscopy

✍ Scribed by N. Khalfaoui; C.C. Rotaru; S. Bouffard; M. Toulemonde; J.P. Stoquert; F. Haas; C. Trautmann; J. Jensen; A. Dunlop

Publisher
Elsevier Science
Year
2005
Tongue
English
Weight
308 KB
Volume
240
Category
Article
ISSN
0168-583X

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