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Characterization of sputter-deposited multilayers of Ni and Zr with APFIM/TAP

✍ Scribed by T. Al-Kassab; M.-P. Macht; V. Naundorf; H. Wollenberger; S. Chambreland; F. Danoix; D. Blavette

No coin nor oath required. For personal study only.

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