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Characterization of SiSiO2 interface with c1− ions by low temperature electron conduction measurements

✍ Scribed by A. Yagi; M. Namiki; K. Kusuda; S. Kawaji

Book ID: 118982454
Publisher: Elsevier Science
Year: 1978
Tongue: English
Weight: 308 KB
Volume: 73
Category: Article
ISSN: 0039-6028
DOI: 10.1016/0039-6028(78)90479-x

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