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Characterization of silicon compounds using the Auger parameter in X-ray Photoelectron Spectroscopy (XPS)

✍ Scribed by Shigemi Kohiki; Shinji Ozaki; Tomoko Hamada; Kazuo Taniguchi

Publisher
Elsevier Science
Year
1987
Tongue
English
Weight
474 KB
Volume
28
Category
Article
ISSN
0169-4332

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