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Characterization of Si3N4/SiC nanocomposite by Raman scattering and XPS

✍ Scribed by Woo-Seok Cho; Yoon-Suk Oh; Chang-Sam Kim; Minoru Osada; Masato Kakihana; Dae-Soon Lim; Deock-Soo Cheong


Book ID
117625308
Publisher
Elsevier Science
Year
1999
Tongue
English
Weight
302 KB
Volume
285
Category
Article
ISSN
0925-8388

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