Characterization of Semiconductor Materials - Principles and Methods, Volume 1

✍ Scribed by McGuire, G.E.(eds.)

Publisher: William Andrew Publishing/Noyes
Year: 1989
Tongue: English
Leaves: 240
Category: Library

No coin nor oath required. For personal study only.

✦ Synopsis

Characterization of semiconductor materials and methods used to characterize them will be described extensively in this new Noyes series. Written by experts in each subject area, the series will present the most up-to-date information available in this rapidly advancing field. Includes chapters on Electrical Characterization, Ion Mass Spectrometry, Photoelectron Spectroscopy, Ion/Solid Interactions and more.

✦ Table of Contents

Content:
Front Matter
• Preface
• Table of Contents
1. Electrical Characterization of Semiconductor Materials and Devices
2. Secondary Ion Mass Spectrometry
3. Photoelectron Spectroscopy: Applications to Semiconductors
4. Ion/Solid Interactions in Surface Analysis
5. Molecular Characterization of Dielectric Films by Laser Raman Spectroscopy
6. Characterization of Semiconductor Surfaces by Appearance Potential Spectroscopy
Index

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