Characterization of Semiconductor Hetero
β Carlo Lamberti
π Library
π
2008
π Elsevier
π English
β¦ LIBER β¦
π
Characterization of Semiconductor Heterostructures and Nanostructures
β Scribed by Giovanni Agostini and Carlo Lamberti (Eds.)
- Year
- 2013
- Tongue
- English
- Leaves
- 811
- Category
- Library
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No coin nor oath required. For personal study only.
β¦ Table of Contents
Content:
Front Matter, Page iii
Copyright, Page iv
Dedication, Page v, Carlo Lamberti
Preface, Pages ix-x, Carlo Lamberti, Giovanni Agostini
Contributors, Pages xi-xiii, Valery V. Afanasβev, Giovanni Agostini, Alfonso Baldereschi, Simon J.L. Billinge, Elisa Borfecchia, F. Boscherini, Emil S. BoΕΎin, Elisa Buffagni, Gema Martinez-Criado, Francesca Detto, Filippo Fabbri, Claudio Ferrari, E. Gatti, Vincenzo Grillo, M. Gurioli, M. Guzzi, Pavol JuhΓ‘s, Carlo Lamberti, Laura Lazzarini, Alessandro Longo, et al.
Chapter 1 - Introduction: The Interdisciplinary Nature of and Nanotechnology and Its Need to Exploit Frontier Characterization Techniques, Pages 1-19, Giovanni Agostini, Carlo Lamberti
Chapter 2 - Ab initio Studies of Structural and Electronic Properties, Pages 21-73, Maria Peressi, Alfonso Baldereschi
Chapter 3 - Strain and Composition Determination in Semiconductor Heterostructures by High-Resolution X-Ray Diffraction, Pages 75-111, Claudio Ferrari, Elisa Buffagni, Francesca Rossi
Chapter 4 - Nanostructures Observed by Surface Sensitive X-Ray Scattering and Highly Focused Beams, Pages 113-173, Tobias SchΓΌlli, Vincent Favre-Nicolin, Marie-Ingrid Richard, Gilles Renaud
Chapter 5 - Small-Angle X-Ray Scattering for the Study of Nanostructures and Nanostructured Materials, Pages 175-228, Giuseppe Portale, Alessandro Longo
Chapter 6 - Local Structure of Bulk and Nanocrystalline Semiconductors Using Total Scattering Methods, Pages 229-257, Emil S. BoΕΎin, Pavol JuhΓ‘s, Simon J.L. Billinge
Chapter 7 - X-Ray Absorption Fine Structure in the Study of Semiconductor Heterostructures and Nanostructures, Pages 259-310, F. Boscherini
Chapter 8 - Grazing Incidence Diffraction Anomalous Fine Structure in the Study of Structural Properties of Nanostructures, Pages 311-359, H. Renevier, M.G. Proietti
Chapter 9 - Micro- and Nano-X-ray Beams, Pages 361-412, Gema Martinez-Criado, Elisa Borfecchia, Lorenzo Mino, Carlo Lamberti
Chapter 10 - Transmission Electron Microscopy Techniques for Imaging and Compositional Evaluation in Semiconductor Heterostructures, Pages 413-465, Laura Lazzarini, Lucia Nasi, Vincenzo Grillo
Chapter 11 - Imaging at the Nanoscale: Scanning Probe Microscopies Applied to Semiconductors, Pages 467-507, Chiara Manfredotti
Chapter 12 - Photoluminescence Characterization of Structural and Electronic Properties of Semiconductor Quantum Wells, Pages 509-556, S. Sanguinetti, M. Guzzi, E. Gatti, M. Gurioli
Chapter 13 - Cathodoluminescence of Self-assembled Nanosystems: The Cases of Tetrapods, Nanowires, and Nanocrystals, Pages 557-601, Giancarlo Salviati, Filippo Fabbri, Francesca Detto, Francesca Rossi, Laura Lazzarini, Takashi Sekiguchi
Chapter 14 - The Role of Photoemission Spectroscopies in Heterojunction Research, Pages 603-639, G. Margaritondo
Chapter 15 - Electrical and Electro-Optical Characterization of Semiconductor Nanowires, Pages 641-684, Lorenzo Rigutti, Maria Tchernycheva
Chapter 16 - Electron Spin Resonance of Interfaces and Nanolayers in Semiconductor Heterostructures, Pages 685-752, Andre Stesmans, Valery V. Afanasβev
Chapter 17 - Raman Spectroscopy, Pages 753-802, Daniel Wolverson
Index, Pages 803-813
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