✦ LIBER ✦

Characterization of semiconducting materials by electron microscopy

✍ Scribed by A. Camanzi

Publisher: Elsevier Science
Year: 1983
Tongue: English
Weight: 96 KB
Volume: 12
Category: Article
ISSN: 0304-3991
DOI: 10.1016/0304-3991(83)90326-1

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Nano-Scale Analytical Characterization o

Nano-Scale Analytical Characterization of Engineering Materials by Transmission Electron Microscopy

✍ T. Epicier; M.-C. Cheynet; J.-M. Martin 📂 Article 📅 2001 🏛 John Wiley and Sons 🌐 English ⚖ 498 KB 👁 2 views

Characterization of silver vanadium oxid

Characterization of silver vanadium oxide cathode material by high-resolution electron microscopy

✍ A.M. Crespi; P.M. Skarstad; H.W. Zandbergen 📂 Article 📅 1995 🏛 Elsevier Science 🌐 English ⚖ 357 KB

Electron microscopy of ceramic materials

✍ G.L. Dunlop 📂 Article 📅 1984 🏛 Elsevier Science 🌐 English ⚖ 88 KB

Characterization of modified polypropyle

Characterization of modified polypropylene by scanning electron microscopy

✍ Peter Poelt; Elisabeth Ingolic; Markus Gahleitner; Klaus Bernreitner; Wolfgang G 📂 Article 📅 2000 🏛 John Wiley and Sons 🌐 English ⚖ 319 KB 👁 2 views

Characterization of interfaces by high r

Characterization of interfaces by high resolution electron microscopy

✍ D.R. Clarke 📂 Article 📅 1981 🏛 Elsevier Science 🌐 English ⚖ 79 KB

Characterization of coked catalysts by s

Characterization of coked catalysts by scanning electron microscopy

✍ J. van Doorn; P. Staugaard 📂 Article 📅 1987 🏛 Elsevier Science 🌐 English ⚖ 106 KB