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Characterization of second and third order optical nonlinearities of ZnO sputtered films

✍ Scribed by M.C. Larciprete; D. Haertle; A. Belardini; M. Bertolotti; F. Sarto; P. Günter

Book ID
106026964
Publisher
Springer
Year
2005
Tongue
English
Weight
459 KB
Volume
82
Category
Article
ISSN
0721-7269

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Au films of thickness ranging between 5 and 52 nm were prepared by sputtering on quartz substrates and their third-order nonlinear optical response was investigated by Optical Kerr effect (OKE) and Z-scan techniques using 532 nm, 35 ps laser pulses. All prepared films were characterized by XRD, AFM