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Characterization of Rh-based catalysts with EPR, TPR, IR and XPS

✍ Scribed by Yi Wang; Zhen Song; Ding Ma; Hongyuan Luo; Dongbai Liang; Xinhe Bao

Book ID
104424558
Publisher
Elsevier Science
Year
1999
Tongue
English
Weight
257 KB
Volume
149
Category
Article
ISSN
1381-1169

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Ahatract-X-ray photoelectron spectroscopy (XPS) is used to characterize oxides anodically formed on near-surface Ir-and Rh-implanted titanium alloys. The oxidation is performed in a (1 M [Cl-], pH = 1.0) solution in which the chlorine evolution reaction is studied subsequently. Good electrocatalytic