XPS characterization of anodic layers grown on Ir- and Rh-implanted titanium

✍ Scribed by C.E. Vallet; A. Choudhury; P.E. Sobol; C.W. White

• Book ID: 103063258
• Publisher: Elsevier Science
• Year: 1993
• Tongue: English
• Weight: 801 KB
• Volume: 38
• Category: Article
• ISSN: 0013-4686
• DOI: 10.1016/0013-4686(93)80064-7

✦ Synopsis

Ahatract-X-ray photoelectron spectroscopy (XPS) is used to characterize oxides anodically formed on near-surface Ir-and Rh-implanted titanium alloys. The oxidation is performed in a (1 M [Cl-], pH = 1.0) solution in which the chlorine evolution reaction is studied subsequently. Good electrocatalytic properties of the Ir/Ti alloy for this reaction appear to be related to the presence of IF and Ti4+ at the surface. In the case of the Rh/Ti alloy, poor electrocatalytic properties are observed together with Rh in the 0 and 1+ valence states and Ti4* at the surface.