Characterization of radiation damage by ellipsometry and channeling

✍ Scribed by Zhang Shuzhi; Wei Ai-jian; Tan Chun-yu; Xia Yue-yuan; Lei Zhen-huan; Zhang Zhaolin; Wang Yihua; Chen Lu; Liu Jia-rui; Zheng Zong-shuang; Zhu Pei-ran

• Publisher: Elsevier Science
• Year: 1989
• Tongue: English
• Weight: 273 KB
• Volume: 39
• Category: Article
• ISSN: 0042-207X
• DOI: 10.1016/0042-207x(89)90183-8