Characterization of Pt∕SrBi[sub 2]Ta[sub 2]O[sub 9]∕Hf–Al–O∕Si field-effect transistors at elevated temperatures

✍ Scribed by Li, Qiu-Hong; Sakai, Shigeki

• Book ID: 121646414
• Publisher: American Institute of Physics
• Year: 2006
• Tongue: English
• Weight: 242 KB
• Volume: 89
• Category: Article
• ISSN: 0003-6951
• DOI: 10.1063/1.2399351