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Characterization of Pr2O3 Added Metals/GaAs Schottky Diodes using X-ray Photoelectron Spectroscopy

✍ Scribed by H. T. Wang; L. B. Chang; Y. C. Cheng; Y. K. Lin; C. I G. Hsu

Publisher: John Wiley and Sons
Year: 1999
Tongue: English
Weight: 93 KB
Volume: 34
Category: Article
ISSN: 0232-1300
DOI: 10.1002/(sici)1521-4079(199909)34:8<1017::aid-crat1017>3.0.co;2-n

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