Characterization of Non-Alloyed Ohmic Contacts to Si-Implanted AlGaN/GaN Heterostructures for High-Electron Mobility Transistors

✍ Scribed by M. Kocan; G.A. Umana-Membreno; J.S. Chung; F. Recht; L. McCarthy; S. Keller; U.K. Mishra; G. Parish; B.D. Nener

• Book ID: 107454924
• Publisher: Springer US
• Year: 2007
• Tongue: English
• Weight: 236 KB
• Volume: 36
• Category: Article
• ISSN: 0361-5235
• DOI: 10.1007/s11664-007-0184-7