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Characterization of NiO thin film grown by two-step processes

✍ Scribed by Xin Wang; Ye Li; GuoZheng Wang; Rong Xiang; DeLong Jiang; ShenCheng Fu; Kui Wu; XiaoYu Yang; QingDuo DuanMu; JingQuan Tian; LiChen Fu

Book ID: 103887004
Publisher: Elsevier Science
Year: 2009
Tongue: English
Weight: 252 KB
Volume: 404
Category: Article
ISSN: 0921-4526
DOI: 10.1016/j.physb.2008.10.059

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