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Characterization of nickel phosphorus surface by ToF-SIMS

✍ Scribed by Bin C. Zhang; Gunter Barth; Hui Kathy Liu; Susan Chang

Publisher: Elsevier Science
Year: 2004
Tongue: English
Weight: 168 KB
Volume: 231-232
Category: Article
ISSN: 0169-4332
DOI: 10.1016/j.apsusc.2004.03.153

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