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Characterization of nanometer-scale defects in metallic glasses by quantitative high-resolution transmission electron microscopy

✍ Scribed by Li, Jing; Wang, Z. L.; Hufnagel, T. C.


Book ID
120836983
Publisher
The American Physical Society
Year
2002
Tongue
English
Weight
441 KB
Volume
65
Category
Article
ISSN
1098-0121

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