An electron diffraction and high-resolution transmission electron microscopy study of defect structure in silicon doped with transition metal impurities

✍ Scribed by N. A. Arkharova; Yu. V. Grigor’ev; V. V. Privesentsev

• Book ID: 111501882
• Publisher: Allerton Press Inc
• Year: 2010
• Tongue: English
• Weight: 482 KB
• Volume: 74
• Category: Article
• ISSN: 1062-8738
• DOI: 10.3103/s1062873810070294