Characterization of nanometer-scale compositional variations using field ion microscopy and the position sensitive atom probe

✍ Scribed by Mackenzie, R.A.D.; Cerezo, A.; Smith, G.D.W.

• Book ID: 123191568
• Publisher: Elsevier Science
• Year: 1993
• Tongue: English
• Weight: 813 KB
• Volume: 3
• Category: Article
• ISSN: 0965-9773
• DOI: 10.1016/0965-9773(93)90080-U