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Atomic structure and compositional analysis of solid surfaces using pulsed-laser ToF atom-probe and field ion microscopy

✍ Scribed by T.T. Tsong

Publisher: Elsevier Science
Year: 1988
Tongue: English
Weight: 376 KB
Volume: 33-34
Category: Article
ISSN: 0169-4332
DOI: 10.1016/0169-4332(88)90282-6

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