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Characterization of multiple carriers in GaN using variable magnetic-field hall measurements

โœ Scribed by C. H. Swartz; R. P. Tompkins; T. H. Myers; D. C. Look; J. R. Sizelove


Book ID
107453237
Publisher
Springer US
Year
2004
Tongue
English
Weight
92 KB
Volume
33
Category
Article
ISSN
0361-5235

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