๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Characterization of multilayer reflectors for the soft X-ray region using synchrotron radiation

โœ Scribed by M Sakurai; J Fujita; K Yamashita; M Ohtani; I Hatsukade; K Tamura; H Nagata; Y Suzuki; S Seki

Publisher
Elsevier Science
Year
1990
Tongue
English
Weight
272 KB
Volume
41
Category
Article
ISSN
0042-207X

No coin nor oath required. For personal study only.

๐Ÿ“œ SIMILAR VOLUMES

Phase-contrast hard X-ray microscopy usi
Phase-contrast hard X-ray microscopy using synchrotron radiation for the diagnosis of onychomycosis
โœ Onseok Lee; Seunghan Ha; Gunwoo Lee; Jaeyoung Kim; Jungyun Huang; Kyeongsik Jin; ๐Ÿ“‚ Article ๐Ÿ“… 2010 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 437 KB ๐Ÿ‘ 1 views

## Abstract Onychomycosis, or fungal infection of the nail, is a disease seen frequently in clinical settings. However, the rates of positive identification using potassium hydroxide preparations or fungal cultures are relatively low. Precise diagnosis is possible via histopathologic examination to