Phase-contrast hard X-ray microscopy using synchrotron radiation for the diagnosis of onychomycosis
✍ Scribed by Onseok Lee; Seunghan Ha; Gunwoo Lee; Jaeyoung Kim; Jungyun Huang; Kyeongsik Jin; Chilhwan Oh
- Publisher
- John Wiley and Sons
- Year
- 2010
- Tongue
- English
- Weight
- 437 KB
- Volume
- 73
- Category
- Article
- ISSN
- 1059-910X
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✦ Synopsis
Abstract
Onychomycosis, or fungal infection of the nail, is a disease seen frequently in clinical settings. However, the rates of positive identification using potassium hydroxide preparations or fungal cultures are relatively low. Precise diagnosis is possible via histopathologic examination to monitor the existence of fungus and performance of a fungal culture for confirmation. Phase‐contrast hard X‐ray microscopy using synchrotron radiation provides 70‐nm spatial resolution and enables imaging of minute internal cellular structures. This study confirms the feasibility of diagnosing onychomycosis using a phase‐contrast hard X‐ray microscope developed at 1B2 beam line using a Pohang light source. Microsc. Res. Tech. 73:1110–1114, 2010. © 2010 Wiley‐Liss, Inc.