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Characterization of MOCVD-grown CdMnTe films by infrared spectroscopy

✍ Scribed by R. Sudharsanan; Z. C. Feng; S. Perkowitz; A. Rohatgi; K. T. Pollard; A. Erbil

Book ID: 112816318
Publisher: Springer US
Year: 1989
Tongue: English
Weight: 236 KB
Volume: 18
Category: Article
ISSN: 0361-5235
DOI: 10.1007/bf02657994

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