Characterization of mechanical properties of VO2 thin films on sapphire and silicon by ultra-microindentation

✍ Scribed by P. Jin; S. Nakao; S. Tanemura; T. Bell; L.S. Wielunski; M.V. Swain

• Book ID: 114086694
• Publisher: Elsevier Science
• Year: 1999
• Tongue: English
• Weight: 407 KB
• Volume: 343-344
• Category: Article
• ISSN: 0040-6090
• DOI: 10.1016/s0040-6090(98)01646-0