This volume is devoted to the consideration of the use use of surface, thin film and interface characterization tools in support of silicon-based semiconductor processing. The approach taken is to consider each of the types of films used in silicon devices individually in its own chapter and to disc
Characterization of Materials
โ Scribed by E. Lifshin (editor)
- Publisher
- Wiley-VCH
- Year
- 1997
- Tongue
- English
- Leaves
- 1449
- Series
- Materials Science and Technology
- Category
- Library
No coin nor oath required. For personal study only.
โฆ Synopsis
Materials Science and Technology is a seminal work and essential reference offering access to a veritable compendium of information covering the most important classes of materials found in industry, including: metals, ceramics, glasses, polymers, semiconductors and composites. Additionally, Materials Science and Technology deals with the applications, processing, and fundamental principles associated with these materials. It clearly and comprehensively provides the user with data from research and industry on the properties, preparation and potential of the individual classes of materials.
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