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Characterization of layout dependent thermal coupling in SOI CMOS current mirrors

✍ Scribed by Tenbroek, B.M.; Redman-White, W.; Lee, M.S.L.; Bunyan, R.J.T.; Uren, M.J.; Brunson, K.M.

Book ID: 114536650
Publisher: IEEE
Year: 1996
Tongue: English
Weight: 724 KB
Volume: 43
Category: Article
ISSN: 0018-9383
DOI: 10.1109/16.544395

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