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Characterization of ion-implanted silica glass by vacuum ultraviolet absorption spectroscopy

✍ Scribed by M. Hattori; Y. Nishihara; Y. Ohki; M. Fujimaki; T. Souno; H. Nishikawa; T. Yamaguchi; E. Watanabe; M. Oikawa; T. Kamiya; K. Arakawa

Book ID: 114165678
Publisher: Elsevier Science
Year: 2002
Tongue: English
Weight: 93 KB
Volume: 191
Category: Article
ISSN: 0168-583X
DOI: 10.1016/s0168-583x(02)00537-2

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Positron Annihilation Spectroscopy (PAS) performed with continuous and pulsed positron beams allows to characterize the size of the intrinsic nano-voids in silica glass, their in depth modification after ion implantation and their decoration by implanted ions. Three complementary PAS techniques, lif