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Characterization of Interstitial Oxygen Striations in Silicon Single Crystals by the Micro-FT-IR Method

✍ Scribed by Iino, Eiichi; Fusegawa, Izumi; Yamagishi, Hirotoshi

Book ID: 115362171
Publisher: Society for Applied Spectroscopy
Year: 1993
Tongue: English
Weight: 411 KB
Volume: 47
Category: Article
ISSN: 0003-7028
DOI: 10.1366/0003702934067711

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