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Characterization of interface structure in GaInAs/InP superlattices by means of X-ray diffraction

✍ Scribed by R. Meyer; M. Hollfelder; H. Hardtdegen; B. Lengeler; H. Lüth


Publisher
Elsevier Science
Year
1992
Tongue
English
Weight
553 KB
Volume
124
Category
Article
ISSN
0022-0248

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