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Characterization of In/Pd and Pd/In/Pd thin films by ellipsometric, XRD and AES methods

✍ Scribed by A.A. Wronkowska; A. Wronkowski; A. Bukaluk; M. Trzciński; K. Okulewicz

Publisher
Elsevier Science
Year
2007
Tongue
English
Weight
488 KB
Volume
253
Category
Article
ISSN
0169-4332

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