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Characterization of flicker noise in GaN-based MODFET's at low drain bias

โœ Scribed by Ho, W.Y.; Surya, C.; Tong, K.Y.; Wook Kim; Botcharev, A.E.; Morkoc, H.


Book ID
114537733
Publisher
IEEE
Year
1999
Tongue
English
Weight
140 KB
Volume
46
Category
Article
ISSN
0018-9383

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