Characterization of embedded phase shift masks by reflectance-transmittance measurement

Materials with Layered Structures. VIII.

Materials with Layered Structures. VIII. Subsolidus Phase Diagram of the System MnIn2S4-MnIn2Se4 and Characterization of the Layered Materials MnIn2SxSe4-x by Electrical Measurements and Diffuse Reflectance Spectroscopy

✍ H. Haeuseler; W. Cordes; D. Reinen; U. Kesper 📂 Article 📅 1993 🏛 Elsevier Science 🌐 English ⚖ 188 KB

In the quasibinary system \(\mathrm{MnIn}_{2} \mathrm{~S}_{4}-\mathrm{MnIn}_{2} \mathrm{Se}_{4}\) a series of solid solutions of general formula \(\mathrm{MnIn}_{2} \mathrm{~S}_{x} \mathrm{Se}_{4-x}\) exists for \(2.4 \geq x \geq 0.2\) with the layered \(\mathrm{MgAl}_{2} \mathrm{~S}_{4}\) structure