Characterization of electron traps in aluminium-implanted SiO2: D. R. Young, D. J. DiMaria, W. R. Hunger and C. M. Serrano. IBM J. Res. Dev. 22, (3) 285 (May 1978)

• Publisher: Elsevier Science
• Year: 1978
• Tongue: English
• Weight: 64 KB
• Volume: 18
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(78)90568-1