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Characterization of electrochemically etched tungsten tips for scanning tunneling microscopy

✍ Scribed by Müller, A.-D.; Müller, F.; Hietschold, M.; Demming, F.; Jersch, J.; Dickmann, K.

Book ID: 121702135
Publisher: American Institute of Physics
Year: 1999
Tongue: English
Weight: 529 KB
Volume: 70
Category: Article
ISSN: 0034-6748
DOI: 10.1063/1.1150022

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