An electrochemical etching procedure for fabricating scanning tunneling microscopy and atom-probe field-ion microscopy tips

✍ Scribed by Yeong-Cheol Kim; David N. Seidman

• Book ID: 105696511
• Publisher: TechnoPress
• Year: 2003
• Tongue: English
• Weight: 523 KB
• Volume: 9
• Category: Article
• ISSN: 1598-9623
• DOI: 10.1007/bf03027195