Characterization of double-layer transparent films on absorbing substrates using multiple-angle ellipsometry

✍ Scribed by T. Easwarakhanthan; Z. Ouennoughi; M. Renard; J.R. Cussenot

• Publisher: Elsevier Science
• Year: 1991
• Tongue: English
• Weight: 550 KB
• Volume: 47
• Category: Article
• ISSN: 0169-4332
• DOI: 10.1016/0169-4332(91)90083-v