An inversion method for the complete characterization of transparent film-absorbing substrate systems using multiple angle ellipsometry

✍ Scribed by T. Easwarakhanthan; Z. Ouennoughi; S. Ravelet

• Publisher: Elsevier Science
• Year: 1992
• Tongue: English
• Weight: 730 KB
• Volume: 35
• Category: Article
• ISSN: 0038-1101
• DOI: 10.1016/0038-1101(92)90288-n